Fix mtest indenting

Some of the inner loops are not indented correctly. Fix this.

Signed-off-by: Simon Glass <sjg@chromium.org>

common/cmd_mem.c

@@ -655,32 +655,31 @@ static ulong mem_test_alt(vu_long *start, vu_long *end)
 		0xaaaaaaaa,	/* alternating 1/0 */
 	};
 
-		/*
-		 * Data line test: write a pattern to the first
-		 * location, write the 1's complement to a 'parking'
-		 * address (changes the state of the data bus so a
-		 * floating bus doesn't give a false OK), and then
-		 * read the value back. Note that we read it back
-		 * into a variable because the next time we read it,
-		 * it might be right (been there, tough to explain to
-		 * the quality guys why it prints a failure when the
-		 * "is" and "should be" are obviously the same in the
-		 * error message).
-		 *
-		 * Rather than exhaustively testing, we test some
-		 * patterns by shifting '1' bits through a field of
-		 * '0's and '0' bits through a field of '1's (i.e.
-		 * pattern and ~pattern).
-		 */
-		addr = start;
-		for (j = 0; j < sizeof(bitpattern) / sizeof(bitpattern[0]);
-				j++) {
-		    val = bitpattern[j];
-		    for (; val != 0; val <<= 1) {
+	/*
+	 * Data line test: write a pattern to the first
+	 * location, write the 1's complement to a 'parking'
+	 * address (changes the state of the data bus so a
+	 * floating bus doesn't give a false OK), and then
+	 * read the value back. Note that we read it back
+	 * into a variable because the next time we read it,
+	 * it might be right (been there, tough to explain to
+	 * the quality guys why it prints a failure when the
+	 * "is" and "should be" are obviously the same in the
+	 * error message).
+	 *
+	 * Rather than exhaustively testing, we test some
+	 * patterns by shifting '1' bits through a field of
+	 * '0's and '0' bits through a field of '1's (i.e.
+	 * pattern and ~pattern).
+	 */
+	addr = start;
+	for (j = 0; j < sizeof(bitpattern) / sizeof(bitpattern[0]); j++) {
+		val = bitpattern[j];
+		for (; val != 0; val <<= 1) {
 			*addr  = val;
 			*dummy  = ~val; /* clear the test data off the bus */
 			readback = *addr;
-			if(readback != val) {
+			if (readback != val) {
 				printf("FAILURE (data line): "
 					"expected %08lx, actual %08lx\n",
 						val, readback);
@@ -703,129 +702,130 @@ static ulong mem_test_alt(vu_long *start, vu_long *end)
 					return -1;
 				}
 			}
-		    }
 		}
+	}
 
-		/*
-		 * Based on code whose Original Author and Copyright
-		 * information follows: Copyright (c) 1998 by Michael
-		 * Barr. This software is placed into the public
-		 * domain and may be used for any purpose. However,
-		 * this notice must not be changed or removed and no
-		 * warranty is either expressed or implied by its
-		 * publication or distribution.
-		 */
+	/*
+	 * Based on code whose Original Author and Copyright
+	 * information follows: Copyright (c) 1998 by Michael
+	 * Barr. This software is placed into the public
+	 * domain and may be used for any purpose. However,
+	 * this notice must not be changed or removed and no
+	 * warranty is either expressed or implied by its
+	 * publication or distribution.
+	 */
 
-		/*
-		 * Address line test
-		 *
-		 * Description: Test the address bus wiring in a
-		 *              memory region by performing a walking
-		 *              1's test on the relevant bits of the
-		 *              address and checking for aliasing.
-		 *              This test will find single-bit
-		 *              address failures such as stuck-high,
-		 *              stuck-low, and shorted pins. The base
-		 *              address and size of the region are
-		 *              selected by the caller.
-		 *
-		 * Notes:	For best results, the selected base
-		 *              address should have enough LSB 0's to
-		 *              guarantee single address bit changes.
-		 *              For example, to test a 64-Kbyte
-		 *              region, select a base address on a
-		 *              64-Kbyte boundary. Also, select the
-		 *              region size as a power-of-two if at
-		 *              all possible.
-		 *
-		 * Returns:     0 if the test succeeds, 1 if the test fails.
-		 */
-		len = ((ulong)end - (ulong)start)/sizeof(vu_long);
-		pattern = (vu_long) 0xaaaaaaaa;
-		anti_pattern = (vu_long) 0x55555555;
+	/*
+	* Address line test
+
+	 * Description: Test the address bus wiring in a
+	 *              memory region by performing a walking
+	 *              1's test on the relevant bits of the
+	 *              address and checking for aliasing.
+	 *              This test will find single-bit
+	 *              address failures such as stuck-high,
+	 *              stuck-low, and shorted pins. The base
+	 *              address and size of the region are
+	 *              selected by the caller.
+
+	 * Notes:	For best results, the selected base
+	 *              address should have enough LSB 0's to
+	 *              guarantee single address bit changes.
+	 *              For example, to test a 64-Kbyte
+	 *              region, select a base address on a
+	 *              64-Kbyte boundary. Also, select the
+	 *              region size as a power-of-two if at
+	 *              all possible.
+	 *
+	 * Returns:     0 if the test succeeds, 1 if the test fails.
+	 */
+	len = ((ulong)end - (ulong)start)/sizeof(vu_long);
+	pattern = (vu_long) 0xaaaaaaaa;
+	anti_pattern = (vu_long) 0x55555555;
 
-		debug("%s:%d: length = 0x%.8lx\n",
-			__func__, __LINE__, len);
-		/*
-		 * Write the default pattern at each of the
-		 * power-of-two offsets.
-		 */
-		for (offset = 1; offset < len; offset <<= 1)
-			start[offset] = pattern;
+	debug("%s:%d: length = 0x%.8lx\n",
+		__func__, __LINE__, len);
+	/*
+	 * Write the default pattern at each of the
+	 * power-of-two offsets.
+	 */
+	for (offset = 1; offset < len; offset <<= 1)
+		start[offset] = pattern;
 
-		/*
-		 * Check for address bits stuck high.
-		 */
-		test_offset = 0;
-		start[test_offset] = anti_pattern;
+	/*
+	 * Check for address bits stuck high.
+	 */
+	test_offset = 0;
+	start[test_offset] = anti_pattern;
 
-		for (offset = 1; offset < len; offset <<= 1) {
-		    temp = start[offset];
-		    if (temp != pattern) {
+	for (offset = 1; offset < len; offset <<= 1) {
+		temp = start[offset];
+		if (temp != pattern) {
 			printf("\nFAILURE: Address bit stuck high @ 0x%.8lx:"
 				" expected 0x%.8lx, actual 0x%.8lx\n",
 				(ulong)&start[offset], pattern, temp);
 			errs++;
 			if (ctrlc()) {
-			    putc('\n');
-			    return -1;
+				putc('\n');
+				return -1;
 			}
-		    }
 		}
-		start[test_offset] = pattern;
-		WATCHDOG_RESET();
+	}
+	start[test_offset] = pattern;
+	WATCHDOG_RESET();
 
-		/*
-		 * Check for addr bits stuck low or shorted.
-		 */
-		for (test_offset = 1; test_offset < len; test_offset <<= 1) {
-		    start[test_offset] = anti_pattern;
+	/*
+	 * Check for addr bits stuck low or shorted.
+	 */
+	for (test_offset = 1; test_offset < len; test_offset <<= 1) {
+		start[test_offset] = anti_pattern;
 
-		    for (offset = 1; offset < len; offset <<= 1) {
+		for (offset = 1; offset < len; offset <<= 1) {
 			temp = start[offset];
 			if ((temp != pattern) && (offset != test_offset)) {
-			    printf("\nFAILURE: Address bit stuck low or shorted @"
-				" 0x%.8lx: expected 0x%.8lx, actual 0x%.8lx\n",
-				(ulong)&start[offset], pattern, temp);
-			    errs++;
-			    if (ctrlc()) {
-				putc('\n');
-				return -1;
-			    }
+				printf("\nFAILURE: Address bit stuck low or"
+					" shorted @ 0x%.8lx: expected 0x%.8lx,"
+					" actual 0x%.8lx\n",
+					(ulong)&start[offset], pattern, temp);
+				errs++;
+				if (ctrlc()) {
+					putc('\n');
+					return -1;
+				}
 			}
-		    }
-		    start[test_offset] = pattern;
 		}
+		start[test_offset] = pattern;
+	}
 
-		/*
-		 * Description: Test the integrity of a physical
-		 *		memory device by performing an
-		 *		increment/decrement test over the
-		 *		entire region. In the process every
-		 *		storage bit in the device is tested
-		 *		as a zero and a one. The base address
-		 *		and the size of the region are
-		 *		selected by the caller.
-		 *
-		 * Returns:     0 if the test succeeds, 1 if the test fails.
-		 */
-		num_words = ((ulong)end - (ulong)start)/sizeof(vu_long) + 1;
+	/*
+	 * Description: Test the integrity of a physical
+	 *		memory device by performing an
+	 *		increment/decrement test over the
+	 *		entire region. In the process every
+	 *		storage bit in the device is tested
+	 *		as a zero and a one. The base address
+	 *		and the size of the region are
+	 *		selected by the caller.
+	 *
+	 * Returns:     0 if the test succeeds, 1 if the test fails.
+	 */
+	num_words = ((ulong)end - (ulong)start)/sizeof(vu_long) + 1;
 
-		/*
-		 * Fill memory with a known pattern.
-		 */
-		for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
-			WATCHDOG_RESET();
-			start[offset] = pattern;
-		}
+	/*
+	 * Fill memory with a known pattern.
+	 */
+	for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
+		WATCHDOG_RESET();
+		start[offset] = pattern;
+	}
 
-		/*
-		 * Check each location and invert it for the second pass.
-		 */
-		for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
-		    WATCHDOG_RESET();
-		    temp = start[offset];
-		    if (temp != pattern) {
+	/*
+	 * Check each location and invert it for the second pass.
+	 */
+	for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
+		WATCHDOG_RESET();
+		temp = start[offset];
+		if (temp != pattern) {
 			printf("\nFAILURE (read/write) @ 0x%.8lx:"
 				" expected 0x%.8lx, actual 0x%.8lx)\n",
 				(ulong)&start[offset], pattern, temp);
@@ -834,20 +834,20 @@ static ulong mem_test_alt(vu_long *start, vu_long *end)
 				putc('\n');
 				return -1;
 			}
-		    }
-
-		    anti_pattern = ~pattern;
-		    start[offset] = anti_pattern;
 		}
 
-		/*
-		 * Check each location for the inverted pattern and zero it.
-		 */
-		for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
-		    WATCHDOG_RESET();
-		    anti_pattern = ~pattern;
-		    temp = start[offset];
-		    if (temp != anti_pattern) {
+		anti_pattern = ~pattern;
+		start[offset] = anti_pattern;
+	}
+
+	/*
+	 * Check each location for the inverted pattern and zero it.
+	 */
+	for (pattern = 1, offset = 0; offset < num_words; pattern++, offset++) {
+		WATCHDOG_RESET();
+		anti_pattern = ~pattern;
+		temp = start[offset];
+		if (temp != anti_pattern) {
 			printf("\nFAILURE (read/write): @ 0x%.8lx:"
 				" expected 0x%.8lx, actual 0x%.8lx)\n",
 				(ulong)&start[offset], anti_pattern, temp);
@@ -856,9 +856,9 @@ static ulong mem_test_alt(vu_long *start, vu_long *end)
 				putc('\n');
 				return -1;
 			}
-		    }
-		    start[offset] = 0;
 		}
+		start[offset] = 0;
+	}
 
 	return 0;
 }
@@ -886,34 +886,34 @@ static ulong mem_test_quick(vu_long *start, vu_long *end, vu_long pattern,
 		else
 			pattern = ~pattern;
 	}
-		printf("\rPattern %08lX  Writing..."
-			"%12s"
-			"\b\b\b\b\b\b\b\b\b\b",
-			pattern, "");
+	printf("\rPattern %08lX  Writing..."
+		"%12s"
+		"\b\b\b\b\b\b\b\b\b\b",
+		pattern, "");
 
-		for (addr = start, val = pattern; addr < end; addr++) {
-			WATCHDOG_RESET();
-			*addr = val;
-			val += incr;
-		}
+	for (addr = start, val = pattern; addr < end; addr++) {
+		WATCHDOG_RESET();
+		*addr = val;
+		val += incr;
+	}
 
-		puts("Reading...");
+	puts("Reading...");
 
-		for (addr = start, val = pattern; addr < end; addr++) {
-			WATCHDOG_RESET();
-			readback = *addr;
-			if (readback != val) {
-				printf("\nMem error @ 0x%08X: "
-					"found %08lX, expected %08lX\n",
-					(uint)(uintptr_t)addr, readback, val);
-				errs++;
-				if (ctrlc()) {
-					putc('\n');
-					return -1;
-				}
+	for (addr = start, val = pattern; addr < end; addr++) {
+		WATCHDOG_RESET();
+		readback = *addr;
+		if (readback != val) {
+			printf("\nMem error @ 0x%08X: "
+				"found %08lX, expected %08lX\n",
+				(uint)(uintptr_t)addr, readback, val);
+			errs++;
+			if (ctrlc()) {
+				putc('\n');
+				return -1;
 			}
-			val += incr;
 		}
+		val += incr;
+	}
 
 	return 0;
 }