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+/*
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+ * linux/drivers/mtd/onenand/onenand_bbt.c
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+ *
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+ * Bad Block Table support for the OneNAND driver
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+ *
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+ * Copyright(c) 2005-2007 Samsung Electronics
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+ * Kyungmin Park <kyungmin.park@samsung.com>
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+ *
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+ * TODO:
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+ * Split BBT core and chip specific BBT.
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+ *
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+ * This program is free software; you can redistribute it and/or modify
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+ * it under the terms of the GNU General Public License version 2 as
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+ * published by the Free Software Foundation.
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+ */
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+
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+#include <common.h>
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+
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+#ifdef CONFIG_CMD_ONENAND
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+
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+#include <linux/mtd/compat.h>
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+#include <linux/mtd/mtd.h>
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+#include <linux/mtd/onenand.h>
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+#include <malloc.h>
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+
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+#include <asm/errno.h>
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+
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+/**
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+ * check_short_pattern - [GENERIC] check if a pattern is in the buffer
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+ * @param buf the buffer to search
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+ * @param len the length of buffer to search
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+ * @param paglen the pagelength
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+ * @param td search pattern descriptor
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+ *
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+ * Check for a pattern at the given place. Used to search bad block
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+ * tables and good / bad block identifiers. Same as check_pattern, but
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+ * no optional empty check and the pattern is expected to start
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+ * at offset 0.
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+ */
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+static int check_short_pattern(uint8_t * buf, int len, int paglen,
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+ struct nand_bbt_descr *td)
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+{
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+ int i;
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+ uint8_t *p = buf;
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+
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+ /* Compare the pattern */
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+ for (i = 0; i < td->len; i++) {
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+ if (p[i] != td->pattern[i])
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+ return -1;
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+ }
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+ return 0;
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+}
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+
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+/**
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+ * create_bbt - [GENERIC] Create a bad block table by scanning the device
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+ * @param mtd MTD device structure
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+ * @param buf temporary buffer
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+ * @param bd descriptor for the good/bad block search pattern
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+ * @param chip create the table for a specific chip, -1 read all chips.
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+ * Applies only if NAND_BBT_PERCHIP option is set
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+ *
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+ * Create a bad block table by scanning the device
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+ * for the given good/bad block identify pattern
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+ */
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+static int create_bbt(struct mtd_info *mtd, uint8_t * buf,
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+ struct nand_bbt_descr *bd, int chip)
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+{
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+ struct onenand_chip *this = mtd->priv;
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+ struct bbm_info *bbm = this->bbm;
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+ int i, j, numblocks, len, scanlen;
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+ int startblock;
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+ loff_t from;
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+ size_t readlen, ooblen;
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+
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+ printk(KERN_INFO "Scanning device for bad blocks\n");
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+
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+ len = 1;
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+
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+ /* We need only read few bytes from the OOB area */
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+ scanlen = ooblen = 0;
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+ readlen = bd->len;
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+
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+ /* chip == -1 case only */
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+ /* Note that numblocks is 2 * (real numblocks) here;
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+ * see i += 2 below as it makses shifting and masking less painful
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+ */
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+ numblocks = mtd->size >> (bbm->bbt_erase_shift - 1);
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+ startblock = 0;
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+ from = 0;
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+
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+ for (i = startblock; i < numblocks;) {
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+ int ret;
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+
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+ for (j = 0; j < len; j++) {
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+ size_t retlen;
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+
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+ /* No need to read pages fully,
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+ * just read required OOB bytes */
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+ ret = onenand_read_oob(mtd,
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+ from + j * mtd->oobblock +
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+ bd->offs, readlen, &retlen,
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+ &buf[0]);
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+
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+ if (ret && ret != -EAGAIN) {
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+ printk("ret = %d\n", ret);
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+ return ret;
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+ }
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+
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+ if (check_short_pattern
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+ (&buf[j * scanlen], scanlen, mtd->oobblock, bd)) {
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+ bbm->bbt[i >> 3] |= 0x03 << (i & 0x6);
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+ printk(KERN_WARNING
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+ "Bad eraseblock %d at 0x%08x\n", i >> 1,
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+ (unsigned int)from);
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+ break;
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+ }
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+ }
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+ i += 2;
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+ from += (1 << bbm->bbt_erase_shift);
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+ }
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+
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+ return 0;
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+}
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+
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+/**
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+ * onenand_memory_bbt - [GENERIC] create a memory based bad block table
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+ * @param mtd MTD device structure
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+ * @param bd descriptor for the good/bad block search pattern
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+ *
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+ * The function creates a memory based bbt by scanning the device
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+ * for manufacturer / software marked good / bad blocks
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+ */
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+static inline int onenand_memory_bbt(struct mtd_info *mtd,
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+ struct nand_bbt_descr *bd)
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+{
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+ unsigned char data_buf[MAX_ONENAND_PAGESIZE];
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+
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+ bd->options &= ~NAND_BBT_SCANEMPTY;
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+ return create_bbt(mtd, data_buf, bd, -1);
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+}
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+
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+/**
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+ * onenand_isbad_bbt - [OneNAND Interface] Check if a block is bad
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+ * @param mtd MTD device structure
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+ * @param offs offset in the device
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+ * @param allowbbt allow access to bad block table region
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+ */
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+static int onenand_isbad_bbt(struct mtd_info *mtd, loff_t offs, int allowbbt)
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+{
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+ struct onenand_chip *this = mtd->priv;
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+ struct bbm_info *bbm = this->bbm;
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+ int block;
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+ uint8_t res;
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+
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+ /* Get block number * 2 */
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+ block = (int)(offs >> (bbm->bbt_erase_shift - 1));
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+ res = (bbm->bbt[block >> 3] >> (block & 0x06)) & 0x03;
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+
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+ DEBUG(MTD_DEBUG_LEVEL2,
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+ "onenand_isbad_bbt: bbt info for offs 0x%08x: (block %d) 0x%02x\n",
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+ (unsigned int)offs, block >> 1, res);
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+
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+ switch ((int)res) {
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+ case 0x00:
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+ return 0;
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+ case 0x01:
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+ return 1;
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+ case 0x02:
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+ return allowbbt ? 0 : 1;
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+ }
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+
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+ return 1;
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+}
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+
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+/**
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+ * onenand_scan_bbt - [OneNAND Interface] scan, find, read and maybe create bad block table(s)
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+ * @param mtd MTD device structure
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+ * @param bd descriptor for the good/bad block search pattern
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+ *
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+ * The function checks, if a bad block table(s) is/are already
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+ * available. If not it scans the device for manufacturer
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+ * marked good / bad blocks and writes the bad block table(s) to
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+ * the selected place.
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+ *
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+ * The bad block table memory is allocated here. It must be freed
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+ * by calling the onenand_free_bbt function.
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+ *
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+ */
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+int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd)
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+{
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+ struct onenand_chip *this = mtd->priv;
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+ struct bbm_info *bbm = this->bbm;
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+ int len, ret = 0;
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+
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+ len = mtd->size >> (this->erase_shift + 2);
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+ /* Allocate memory (2bit per block) */
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+ bbm->bbt = malloc(len);
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+ if (!bbm->bbt) {
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+ printk(KERN_ERR "onenand_scan_bbt: Out of memory\n");
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+ return -ENOMEM;
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+ }
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+ /* Clear the memory bad block table */
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+ memset(bbm->bbt, 0x00, len);
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+
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+ /* Set the bad block position */
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+ bbm->badblockpos = ONENAND_BADBLOCK_POS;
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+
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+ /* Set erase shift */
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+ bbm->bbt_erase_shift = this->erase_shift;
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+
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+ if (!bbm->isbad_bbt)
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+ bbm->isbad_bbt = onenand_isbad_bbt;
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+
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+ /* Scan the device to build a memory based bad block table */
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+ if ((ret = onenand_memory_bbt(mtd, bd))) {
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+ printk(KERN_ERR
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+ "onenand_scan_bbt: Can't scan flash and build the RAM-based BBT\n");
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+ free(bbm->bbt);
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+ bbm->bbt = NULL;
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+ }
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+
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+ return ret;
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+}
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+
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+/*
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+ * Define some generic bad / good block scan pattern which are used
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+ * while scanning a device for factory marked good / bad blocks.
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+ */
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+static uint8_t scan_ff_pattern[] = { 0xff, 0xff };
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+
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+static struct nand_bbt_descr largepage_memorybased = {
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+ .options = 0,
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+ .offs = 0,
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+ .len = 2,
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+ .pattern = scan_ff_pattern,
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+};
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+
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+/**
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+ * onenand_default_bbt - [OneNAND Interface] Select a default bad block table for the device
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+ * @param mtd MTD device structure
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+ *
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+ * This function selects the default bad block table
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+ * support for the device and calls the onenand_scan_bbt function
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+ */
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+int onenand_default_bbt(struct mtd_info *mtd)
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+{
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+ struct onenand_chip *this = mtd->priv;
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+ struct bbm_info *bbm;
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+
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+ this->bbm = malloc(sizeof(struct bbm_info));
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+ if (!this->bbm)
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+ return -ENOMEM;
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+
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+ bbm = this->bbm;
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+
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+ memset(bbm, 0, sizeof(struct bbm_info));
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+
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+ /* 1KB page has same configuration as 2KB page */
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+ if (!bbm->badblock_pattern)
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+ bbm->badblock_pattern = &largepage_memorybased;
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+
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+ return onenand_scan_bbt(mtd, bbm->badblock_pattern);
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+}
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+
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+#endif /* CFG_CMD_ONENAND */
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