nand.h 19 KB

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  1. /*
  2. * linux/include/linux/mtd/nand.h
  3. *
  4. * Copyright (c) 2000 David Woodhouse <dwmw2@mvhi.com>
  5. * Steven J. Hill <sjhill@realitydiluted.com>
  6. * Thomas Gleixner <tglx@linutronix.de>
  7. *
  8. * $Id: nand.h,v 1.73 2005/05/31 19:39:17 gleixner Exp $
  9. *
  10. * This program is free software; you can redistribute it and/or modify
  11. * it under the terms of the GNU General Public License version 2 as
  12. * published by the Free Software Foundation.
  13. *
  14. * Info:
  15. * Contains standard defines and IDs for NAND flash devices
  16. *
  17. * Changelog:
  18. * 01-31-2000 DMW Created
  19. * 09-18-2000 SJH Moved structure out of the Disk-On-Chip drivers
  20. * so it can be used by other NAND flash device
  21. * drivers. I also changed the copyright since none
  22. * of the original contents of this file are specific
  23. * to DoC devices. David can whack me with a baseball
  24. * bat later if I did something naughty.
  25. * 10-11-2000 SJH Added private NAND flash structure for driver
  26. * 10-24-2000 SJH Added prototype for 'nand_scan' function
  27. * 10-29-2001 TG changed nand_chip structure to support
  28. * hardwarespecific function for accessing control lines
  29. * 02-21-2002 TG added support for different read/write adress and
  30. * ready/busy line access function
  31. * 02-26-2002 TG added chip_delay to nand_chip structure to optimize
  32. * command delay times for different chips
  33. * 04-28-2002 TG OOB config defines moved from nand.c to avoid duplicate
  34. * defines in jffs2/wbuf.c
  35. * 08-07-2002 TG forced bad block location to byte 5 of OOB, even if
  36. * CONFIG_MTD_NAND_ECC_JFFS2 is not set
  37. * 08-10-2002 TG extensions to nand_chip structure to support HW-ECC
  38. *
  39. * 08-29-2002 tglx nand_chip structure: data_poi for selecting
  40. * internal / fs-driver buffer
  41. * support for 6byte/512byte hardware ECC
  42. * read_ecc, write_ecc extended for different oob-layout
  43. * oob layout selections: NAND_NONE_OOB, NAND_JFFS2_OOB,
  44. * NAND_YAFFS_OOB
  45. * 11-25-2002 tglx Added Manufacturer code FUJITSU, NATIONAL
  46. * Split manufacturer and device ID structures
  47. *
  48. * 02-08-2004 tglx added option field to nand structure for chip anomalities
  49. * 05-25-2004 tglx added bad block table support, ST-MICRO manufacturer id
  50. * update of nand_chip structure description
  51. * 01-17-2005 dmarlin added extended commands for AG-AND device and added option
  52. * for BBT_AUTO_REFRESH.
  53. * 01-20-2005 dmarlin added optional pointer to hardware specific callback for
  54. * extra error status checks.
  55. */
  56. #ifndef __LINUX_MTD_NAND_H
  57. #define __LINUX_MTD_NAND_H
  58. #include <linux/config.h>
  59. #include <linux/wait.h>
  60. #include <linux/spinlock.h>
  61. #include <linux/mtd/mtd.h>
  62. struct mtd_info;
  63. /* Scan and identify a NAND device */
  64. extern int nand_scan (struct mtd_info *mtd, int max_chips);
  65. /* Free resources held by the NAND device */
  66. extern void nand_release (struct mtd_info *mtd);
  67. /* Read raw data from the device without ECC */
  68. extern int nand_read_raw (struct mtd_info *mtd, uint8_t *buf, loff_t from, size_t len, size_t ooblen);
  69. /* The maximum number of NAND chips in an array */
  70. #define NAND_MAX_CHIPS 8
  71. /* This constant declares the max. oobsize / page, which
  72. * is supported now. If you add a chip with bigger oobsize/page
  73. * adjust this accordingly.
  74. */
  75. #define NAND_MAX_OOBSIZE 64
  76. /*
  77. * Constants for hardware specific CLE/ALE/NCE function
  78. */
  79. /* Select the chip by setting nCE to low */
  80. #define NAND_CTL_SETNCE 1
  81. /* Deselect the chip by setting nCE to high */
  82. #define NAND_CTL_CLRNCE 2
  83. /* Select the command latch by setting CLE to high */
  84. #define NAND_CTL_SETCLE 3
  85. /* Deselect the command latch by setting CLE to low */
  86. #define NAND_CTL_CLRCLE 4
  87. /* Select the address latch by setting ALE to high */
  88. #define NAND_CTL_SETALE 5
  89. /* Deselect the address latch by setting ALE to low */
  90. #define NAND_CTL_CLRALE 6
  91. /* Set write protection by setting WP to high. Not used! */
  92. #define NAND_CTL_SETWP 7
  93. /* Clear write protection by setting WP to low. Not used! */
  94. #define NAND_CTL_CLRWP 8
  95. /*
  96. * Standard NAND flash commands
  97. */
  98. #define NAND_CMD_READ0 0
  99. #define NAND_CMD_READ1 1
  100. #define NAND_CMD_PAGEPROG 0x10
  101. #define NAND_CMD_READOOB 0x50
  102. #define NAND_CMD_ERASE1 0x60
  103. #define NAND_CMD_STATUS 0x70
  104. #define NAND_CMD_STATUS_MULTI 0x71
  105. #define NAND_CMD_SEQIN 0x80
  106. #define NAND_CMD_READID 0x90
  107. #define NAND_CMD_ERASE2 0xd0
  108. #define NAND_CMD_RESET 0xff
  109. /* Extended commands for large page devices */
  110. #define NAND_CMD_READSTART 0x30
  111. #define NAND_CMD_CACHEDPROG 0x15
  112. /* Extended commands for AG-AND device */
  113. /*
  114. * Note: the command for NAND_CMD_DEPLETE1 is really 0x00 but
  115. * there is no way to distinguish that from NAND_CMD_READ0
  116. * until the remaining sequence of commands has been completed
  117. * so add a high order bit and mask it off in the command.
  118. */
  119. #define NAND_CMD_DEPLETE1 0x100
  120. #define NAND_CMD_DEPLETE2 0x38
  121. #define NAND_CMD_STATUS_MULTI 0x71
  122. #define NAND_CMD_STATUS_ERROR 0x72
  123. /* multi-bank error status (banks 0-3) */
  124. #define NAND_CMD_STATUS_ERROR0 0x73
  125. #define NAND_CMD_STATUS_ERROR1 0x74
  126. #define NAND_CMD_STATUS_ERROR2 0x75
  127. #define NAND_CMD_STATUS_ERROR3 0x76
  128. #define NAND_CMD_STATUS_RESET 0x7f
  129. #define NAND_CMD_STATUS_CLEAR 0xff
  130. /* Status bits */
  131. #define NAND_STATUS_FAIL 0x01
  132. #define NAND_STATUS_FAIL_N1 0x02
  133. #define NAND_STATUS_TRUE_READY 0x20
  134. #define NAND_STATUS_READY 0x40
  135. #define NAND_STATUS_WP 0x80
  136. /*
  137. * Constants for ECC_MODES
  138. */
  139. /* No ECC. Usage is not recommended ! */
  140. #define NAND_ECC_NONE 0
  141. /* Software ECC 3 byte ECC per 256 Byte data */
  142. #define NAND_ECC_SOFT 1
  143. /* Hardware ECC 3 byte ECC per 256 Byte data */
  144. #define NAND_ECC_HW3_256 2
  145. /* Hardware ECC 3 byte ECC per 512 Byte data */
  146. #define NAND_ECC_HW3_512 3
  147. /* Hardware ECC 3 byte ECC per 512 Byte data */
  148. #define NAND_ECC_HW6_512 4
  149. /* Hardware ECC 8 byte ECC per 512 Byte data */
  150. #define NAND_ECC_HW8_512 6
  151. /* Hardware ECC 12 byte ECC per 2048 Byte data */
  152. #define NAND_ECC_HW12_2048 7
  153. /*
  154. * Constants for Hardware ECC
  155. */
  156. /* Reset Hardware ECC for read */
  157. #define NAND_ECC_READ 0
  158. /* Reset Hardware ECC for write */
  159. #define NAND_ECC_WRITE 1
  160. /* Enable Hardware ECC before syndrom is read back from flash */
  161. #define NAND_ECC_READSYN 2
  162. /* Bit mask for flags passed to do_nand_read_ecc */
  163. #define NAND_GET_DEVICE 0x80
  164. /* Option constants for bizarre disfunctionality and real
  165. * features
  166. */
  167. /* Chip can not auto increment pages */
  168. #define NAND_NO_AUTOINCR 0x00000001
  169. /* Buswitdh is 16 bit */
  170. #define NAND_BUSWIDTH_16 0x00000002
  171. /* Device supports partial programming without padding */
  172. #define NAND_NO_PADDING 0x00000004
  173. /* Chip has cache program function */
  174. #define NAND_CACHEPRG 0x00000008
  175. /* Chip has copy back function */
  176. #define NAND_COPYBACK 0x00000010
  177. /* AND Chip which has 4 banks and a confusing page / block
  178. * assignment. See Renesas datasheet for further information */
  179. #define NAND_IS_AND 0x00000020
  180. /* Chip has a array of 4 pages which can be read without
  181. * additional ready /busy waits */
  182. #define NAND_4PAGE_ARRAY 0x00000040
  183. /* Chip requires that BBT is periodically rewritten to prevent
  184. * bits from adjacent blocks from 'leaking' in altering data.
  185. * This happens with the Renesas AG-AND chips, possibly others. */
  186. #define BBT_AUTO_REFRESH 0x00000080
  187. /* Options valid for Samsung large page devices */
  188. #define NAND_SAMSUNG_LP_OPTIONS \
  189. (NAND_NO_PADDING | NAND_CACHEPRG | NAND_COPYBACK)
  190. /* Macros to identify the above */
  191. #define NAND_CANAUTOINCR(chip) (!(chip->options & NAND_NO_AUTOINCR))
  192. #define NAND_MUST_PAD(chip) (!(chip->options & NAND_NO_PADDING))
  193. #define NAND_HAS_CACHEPROG(chip) ((chip->options & NAND_CACHEPRG))
  194. #define NAND_HAS_COPYBACK(chip) ((chip->options & NAND_COPYBACK))
  195. /* Mask to zero out the chip options, which come from the id table */
  196. #define NAND_CHIPOPTIONS_MSK (0x0000ffff & ~NAND_NO_AUTOINCR)
  197. /* Non chip related options */
  198. /* Use a flash based bad block table. This option is passed to the
  199. * default bad block table function. */
  200. #define NAND_USE_FLASH_BBT 0x00010000
  201. /* The hw ecc generator provides a syndrome instead a ecc value on read
  202. * This can only work if we have the ecc bytes directly behind the
  203. * data bytes. Applies for DOC and AG-AND Renesas HW Reed Solomon generators */
  204. #define NAND_HWECC_SYNDROME 0x00020000
  205. /* This option skips the bbt scan during initialization. */
  206. #define NAND_SKIP_BBTSCAN 0x00040000
  207. /* Options set by nand scan */
  208. /* Nand scan has allocated oob_buf */
  209. #define NAND_OOBBUF_ALLOC 0x40000000
  210. /* Nand scan has allocated data_buf */
  211. #define NAND_DATABUF_ALLOC 0x80000000
  212. /*
  213. * nand_state_t - chip states
  214. * Enumeration for NAND flash chip state
  215. */
  216. typedef enum {
  217. FL_READY,
  218. FL_READING,
  219. FL_WRITING,
  220. FL_ERASING,
  221. FL_SYNCING,
  222. FL_CACHEDPRG,
  223. } nand_state_t;
  224. /* Keep gcc happy */
  225. struct nand_chip;
  226. /**
  227. * struct nand_hw_control - Control structure for hardware controller (e.g ECC generator) shared among independend devices
  228. * @lock: protection lock
  229. * @active: the mtd device which holds the controller currently
  230. * @wq: wait queue to sleep on if a NAND operation is in progress
  231. * used instead of the per chip wait queue when a hw controller is available
  232. */
  233. struct nand_hw_control {
  234. spinlock_t lock;
  235. struct nand_chip *active;
  236. wait_queue_head_t wq;
  237. };
  238. /**
  239. * struct nand_chip - NAND Private Flash Chip Data
  240. * @IO_ADDR_R: [BOARDSPECIFIC] address to read the 8 I/O lines of the flash device
  241. * @IO_ADDR_W: [BOARDSPECIFIC] address to write the 8 I/O lines of the flash device
  242. * @read_byte: [REPLACEABLE] read one byte from the chip
  243. * @write_byte: [REPLACEABLE] write one byte to the chip
  244. * @read_word: [REPLACEABLE] read one word from the chip
  245. * @write_word: [REPLACEABLE] write one word to the chip
  246. * @write_buf: [REPLACEABLE] write data from the buffer to the chip
  247. * @read_buf: [REPLACEABLE] read data from the chip into the buffer
  248. * @verify_buf: [REPLACEABLE] verify buffer contents against the chip data
  249. * @select_chip: [REPLACEABLE] select chip nr
  250. * @block_bad: [REPLACEABLE] check, if the block is bad
  251. * @block_markbad: [REPLACEABLE] mark the block bad
  252. * @hwcontrol: [BOARDSPECIFIC] hardwarespecific function for accesing control-lines
  253. * @dev_ready: [BOARDSPECIFIC] hardwarespecific function for accesing device ready/busy line
  254. * If set to NULL no access to ready/busy is available and the ready/busy information
  255. * is read from the chip status register
  256. * @cmdfunc: [REPLACEABLE] hardwarespecific function for writing commands to the chip
  257. * @waitfunc: [REPLACEABLE] hardwarespecific function for wait on ready
  258. * @calculate_ecc: [REPLACEABLE] function for ecc calculation or readback from ecc hardware
  259. * @correct_data: [REPLACEABLE] function for ecc correction, matching to ecc generator (sw/hw)
  260. * @enable_hwecc: [BOARDSPECIFIC] function to enable (reset) hardware ecc generator. Must only
  261. * be provided if a hardware ECC is available
  262. * @erase_cmd: [INTERN] erase command write function, selectable due to AND support
  263. * @scan_bbt: [REPLACEABLE] function to scan bad block table
  264. * @eccmode: [BOARDSPECIFIC] mode of ecc, see defines
  265. * @eccsize: [INTERN] databytes used per ecc-calculation
  266. * @eccbytes: [INTERN] number of ecc bytes per ecc-calculation step
  267. * @eccsteps: [INTERN] number of ecc calculation steps per page
  268. * @chip_delay: [BOARDSPECIFIC] chip dependent delay for transfering data from array to read regs (tR)
  269. * @chip_lock: [INTERN] spinlock used to protect access to this structure and the chip
  270. * @wq: [INTERN] wait queue to sleep on if a NAND operation is in progress
  271. * @state: [INTERN] the current state of the NAND device
  272. * @page_shift: [INTERN] number of address bits in a page (column address bits)
  273. * @phys_erase_shift: [INTERN] number of address bits in a physical eraseblock
  274. * @bbt_erase_shift: [INTERN] number of address bits in a bbt entry
  275. * @chip_shift: [INTERN] number of address bits in one chip
  276. * @data_buf: [INTERN] internal buffer for one page + oob
  277. * @oob_buf: [INTERN] oob buffer for one eraseblock
  278. * @oobdirty: [INTERN] indicates that oob_buf must be reinitialized
  279. * @data_poi: [INTERN] pointer to a data buffer
  280. * @options: [BOARDSPECIFIC] various chip options. They can partly be set to inform nand_scan about
  281. * special functionality. See the defines for further explanation
  282. * @badblockpos: [INTERN] position of the bad block marker in the oob area
  283. * @numchips: [INTERN] number of physical chips
  284. * @chipsize: [INTERN] the size of one chip for multichip arrays
  285. * @pagemask: [INTERN] page number mask = number of (pages / chip) - 1
  286. * @pagebuf: [INTERN] holds the pagenumber which is currently in data_buf
  287. * @autooob: [REPLACEABLE] the default (auto)placement scheme
  288. * @bbt: [INTERN] bad block table pointer
  289. * @bbt_td: [REPLACEABLE] bad block table descriptor for flash lookup
  290. * @bbt_md: [REPLACEABLE] bad block table mirror descriptor
  291. * @badblock_pattern: [REPLACEABLE] bad block scan pattern used for initial bad block scan
  292. * @controller: [OPTIONAL] a pointer to a hardware controller structure which is shared among multiple independend devices
  293. * @priv: [OPTIONAL] pointer to private chip date
  294. * @errstat: [OPTIONAL] hardware specific function to perform additional error status checks
  295. * (determine if errors are correctable)
  296. */
  297. struct nand_chip {
  298. void __iomem *IO_ADDR_R;
  299. void __iomem *IO_ADDR_W;
  300. u_char (*read_byte)(struct mtd_info *mtd);
  301. void (*write_byte)(struct mtd_info *mtd, u_char byte);
  302. u16 (*read_word)(struct mtd_info *mtd);
  303. void (*write_word)(struct mtd_info *mtd, u16 word);
  304. void (*write_buf)(struct mtd_info *mtd, const u_char *buf, int len);
  305. void (*read_buf)(struct mtd_info *mtd, u_char *buf, int len);
  306. int (*verify_buf)(struct mtd_info *mtd, const u_char *buf, int len);
  307. void (*select_chip)(struct mtd_info *mtd, int chip);
  308. int (*block_bad)(struct mtd_info *mtd, loff_t ofs, int getchip);
  309. int (*block_markbad)(struct mtd_info *mtd, loff_t ofs);
  310. void (*hwcontrol)(struct mtd_info *mtd, int cmd);
  311. int (*dev_ready)(struct mtd_info *mtd);
  312. void (*cmdfunc)(struct mtd_info *mtd, unsigned command, int column, int page_addr);
  313. int (*waitfunc)(struct mtd_info *mtd, struct nand_chip *this, int state);
  314. int (*calculate_ecc)(struct mtd_info *mtd, const u_char *dat, u_char *ecc_code);
  315. int (*correct_data)(struct mtd_info *mtd, u_char *dat, u_char *read_ecc, u_char *calc_ecc);
  316. void (*enable_hwecc)(struct mtd_info *mtd, int mode);
  317. void (*erase_cmd)(struct mtd_info *mtd, int page);
  318. int (*scan_bbt)(struct mtd_info *mtd);
  319. int eccmode;
  320. int eccsize;
  321. int eccbytes;
  322. int eccsteps;
  323. int chip_delay;
  324. spinlock_t chip_lock;
  325. wait_queue_head_t wq;
  326. nand_state_t state;
  327. int page_shift;
  328. int phys_erase_shift;
  329. int bbt_erase_shift;
  330. int chip_shift;
  331. u_char *data_buf;
  332. u_char *oob_buf;
  333. int oobdirty;
  334. u_char *data_poi;
  335. unsigned int options;
  336. int badblockpos;
  337. int numchips;
  338. unsigned long chipsize;
  339. int pagemask;
  340. int pagebuf;
  341. struct nand_oobinfo *autooob;
  342. uint8_t *bbt;
  343. struct nand_bbt_descr *bbt_td;
  344. struct nand_bbt_descr *bbt_md;
  345. struct nand_bbt_descr *badblock_pattern;
  346. struct nand_hw_control *controller;
  347. void *priv;
  348. int (*errstat)(struct mtd_info *mtd, struct nand_chip *this, int state, int status, int page);
  349. };
  350. /*
  351. * NAND Flash Manufacturer ID Codes
  352. */
  353. #define NAND_MFR_TOSHIBA 0x98
  354. #define NAND_MFR_SAMSUNG 0xec
  355. #define NAND_MFR_FUJITSU 0x04
  356. #define NAND_MFR_NATIONAL 0x8f
  357. #define NAND_MFR_RENESAS 0x07
  358. #define NAND_MFR_STMICRO 0x20
  359. #define NAND_MFR_HYNIX 0xad
  360. /**
  361. * struct nand_flash_dev - NAND Flash Device ID Structure
  362. *
  363. * @name: Identify the device type
  364. * @id: device ID code
  365. * @pagesize: Pagesize in bytes. Either 256 or 512 or 0
  366. * If the pagesize is 0, then the real pagesize
  367. * and the eraseize are determined from the
  368. * extended id bytes in the chip
  369. * @erasesize: Size of an erase block in the flash device.
  370. * @chipsize: Total chipsize in Mega Bytes
  371. * @options: Bitfield to store chip relevant options
  372. */
  373. struct nand_flash_dev {
  374. char *name;
  375. int id;
  376. unsigned long pagesize;
  377. unsigned long chipsize;
  378. unsigned long erasesize;
  379. unsigned long options;
  380. };
  381. /**
  382. * struct nand_manufacturers - NAND Flash Manufacturer ID Structure
  383. * @name: Manufacturer name
  384. * @id: manufacturer ID code of device.
  385. */
  386. struct nand_manufacturers {
  387. int id;
  388. char * name;
  389. };
  390. extern struct nand_flash_dev nand_flash_ids[];
  391. extern struct nand_manufacturers nand_manuf_ids[];
  392. /**
  393. * struct nand_bbt_descr - bad block table descriptor
  394. * @options: options for this descriptor
  395. * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE
  396. * when bbt is searched, then we store the found bbts pages here.
  397. * Its an array and supports up to 8 chips now
  398. * @offs: offset of the pattern in the oob area of the page
  399. * @veroffs: offset of the bbt version counter in the oob are of the page
  400. * @version: version read from the bbt page during scan
  401. * @len: length of the pattern, if 0 no pattern check is performed
  402. * @maxblocks: maximum number of blocks to search for a bbt. This number of
  403. * blocks is reserved at the end of the device where the tables are
  404. * written.
  405. * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than
  406. * bad) block in the stored bbt
  407. * @pattern: pattern to identify bad block table or factory marked good /
  408. * bad blocks, can be NULL, if len = 0
  409. *
  410. * Descriptor for the bad block table marker and the descriptor for the
  411. * pattern which identifies good and bad blocks. The assumption is made
  412. * that the pattern and the version count are always located in the oob area
  413. * of the first block.
  414. */
  415. struct nand_bbt_descr {
  416. int options;
  417. int pages[NAND_MAX_CHIPS];
  418. int offs;
  419. int veroffs;
  420. uint8_t version[NAND_MAX_CHIPS];
  421. int len;
  422. int maxblocks;
  423. int reserved_block_code;
  424. uint8_t *pattern;
  425. };
  426. /* Options for the bad block table descriptors */
  427. /* The number of bits used per block in the bbt on the device */
  428. #define NAND_BBT_NRBITS_MSK 0x0000000F
  429. #define NAND_BBT_1BIT 0x00000001
  430. #define NAND_BBT_2BIT 0x00000002
  431. #define NAND_BBT_4BIT 0x00000004
  432. #define NAND_BBT_8BIT 0x00000008
  433. /* The bad block table is in the last good block of the device */
  434. #define NAND_BBT_LASTBLOCK 0x00000010
  435. /* The bbt is at the given page, else we must scan for the bbt */
  436. #define NAND_BBT_ABSPAGE 0x00000020
  437. /* The bbt is at the given page, else we must scan for the bbt */
  438. #define NAND_BBT_SEARCH 0x00000040
  439. /* bbt is stored per chip on multichip devices */
  440. #define NAND_BBT_PERCHIP 0x00000080
  441. /* bbt has a version counter at offset veroffs */
  442. #define NAND_BBT_VERSION 0x00000100
  443. /* Create a bbt if none axists */
  444. #define NAND_BBT_CREATE 0x00000200
  445. /* Search good / bad pattern through all pages of a block */
  446. #define NAND_BBT_SCANALLPAGES 0x00000400
  447. /* Scan block empty during good / bad block scan */
  448. #define NAND_BBT_SCANEMPTY 0x00000800
  449. /* Write bbt if neccecary */
  450. #define NAND_BBT_WRITE 0x00001000
  451. /* Read and write back block contents when writing bbt */
  452. #define NAND_BBT_SAVECONTENT 0x00002000
  453. /* Search good / bad pattern on the first and the second page */
  454. #define NAND_BBT_SCAN2NDPAGE 0x00004000
  455. /* The maximum number of blocks to scan for a bbt */
  456. #define NAND_BBT_SCAN_MAXBLOCKS 4
  457. extern int nand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd);
  458. extern int nand_update_bbt (struct mtd_info *mtd, loff_t offs);
  459. extern int nand_default_bbt (struct mtd_info *mtd);
  460. extern int nand_isbad_bbt (struct mtd_info *mtd, loff_t offs, int allowbbt);
  461. extern int nand_erase_nand (struct mtd_info *mtd, struct erase_info *instr, int allowbbt);
  462. extern int nand_do_read_ecc (struct mtd_info *mtd, loff_t from, size_t len,
  463. size_t * retlen, u_char * buf, u_char * oob_buf,
  464. struct nand_oobinfo *oobsel, int flags);
  465. /*
  466. * Constants for oob configuration
  467. */
  468. #define NAND_SMALL_BADBLOCK_POS 5
  469. #define NAND_LARGE_BADBLOCK_POS 0
  470. #endif /* __LINUX_MTD_NAND_H */