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@@ -135,3 +135,39 @@ Description:
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have multiple ecc steps within each writesize region.
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In the case of devices lacking any ECC capability, it is 0.
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+
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+What: /sys/class/mtd/mtdX/bitflip_threshold
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+Date: April 2012
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+KernelVersion: 3.4
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+Contact: linux-mtd@lists.infradead.org
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+Description:
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+ This allows the user to examine and adjust the criteria by which
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+ mtd returns -EUCLEAN from mtd_read(). If the maximum number of
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+ bit errors that were corrected on any single region comprising
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+ an ecc step (as reported by the driver) equals or exceeds this
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+ value, -EUCLEAN is returned. Otherwise, absent an error, 0 is
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+ returned. Higher layers (e.g., UBI) use this return code as an
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+ indication that an erase block may be degrading and should be
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+ scrutinized as a candidate for being marked as bad.
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+
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+ The initial value may be specified by the flash device driver.
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+ If not, then the default value is ecc_strength.
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+
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+ The introduction of this feature brings a subtle change to the
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+ meaning of the -EUCLEAN return code. Previously, it was
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+ interpreted to mean simply "one or more bit errors were
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+ corrected". Its new interpretation can be phrased as "a
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+ dangerously high number of bit errors were corrected on one or
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+ more regions comprising an ecc step". The precise definition of
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+ "dangerously high" can be adjusted by the user with
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+ bitflip_threshold. Users are discouraged from doing this,
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+ however, unless they know what they are doing and have intimate
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+ knowledge of the properties of their device. Broadly speaking,
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+ bitflip_threshold should be low enough to detect genuine erase
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+ block degradation, but high enough to avoid the consequences of
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+ a persistent return value of -EUCLEAN on devices where sticky
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+ bitflips occur. Note that if bitflip_threshold exceeds
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+ ecc_strength, -EUCLEAN is never returned by the read functions.
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+
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+ This is generally applicable only to NAND flash devices with ECC
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+ capability. It is ignored on devices lacking ECC capability.
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