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@@ -857,6 +857,17 @@ static void mxc_nand_command(struct mtd_info *mtd, unsigned command,
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}
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}
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+/* Define some generic bad / good block scan pattern which are used
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+ * while scanning a device for factory marked good / bad blocks. */
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+static uint8_t scan_ff_pattern[] = { 0xff, 0xff };
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+
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+static struct nand_bbt_descr smallpage_memorybased = {
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+ .options = NAND_BBT_SCAN2NDPAGE,
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+ .offs = 5,
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+ .len = 1,
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+ .pattern = scan_ff_pattern
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+};
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+
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static int __init mxcnd_probe(struct platform_device *pdev)
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{
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struct nand_chip *this;
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@@ -973,7 +984,10 @@ static int __init mxcnd_probe(struct platform_device *pdev)
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goto escan;
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}
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- host->pagesize_2k = (mtd->writesize == 2048) ? 1 : 0;
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+ if (mtd->writesize == 2048) {
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+ host->pagesize_2k = 1;
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+ this->badblock_pattern = &smallpage_memorybased;
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+ }
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if (this->ecc.mode == NAND_ECC_HW) {
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switch (mtd->oobsize) {
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